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2024

7.
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

Fangzhou Xia*; Ivo W Rangelow; Kamal Youcef-Toumi

Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation Book

Springer, 2024, ISBN: 978-3-031-44232-2.

Abstract | Links | BibTeX | Tags: Actuator, Atomic Force Microscopy, Design, Education, Experimentation, Instrumentation, Mechatronics, MEMS, Modeling & Simulation, Motion Control, Nanorobotics, Piezoelectricity, Review, Sensor, Signal Processing, Theory

2022

6.
Comprehensive study of charge-based motion control for piezoelectric nanopositioners: Modeling, instrumentation and controller design

Chen Yang*; Fangzhou Xia; Yi Wang; Kamal Youcef-Toumi

Comprehensive study of charge-based motion control for piezoelectric nanopositioners: Modeling, instrumentation and controller design Journal Article

In: Mechanical Systems and Signal Processing, vol. 166, pp. 108477, 2022, ISSN: 0888-3270.

Abstract | Links | BibTeX | Tags: Actuator, Experimentation, Instrumentation, Mechatronics, Modeling & Simulation, Motion Control, Piezoelectricity, Theory

2021

5.
Statically Stable Charge Sensing Method for Precise Displacement Estimation of Piezoelectric Stack-Based Nanopositioning

Chen Yang*; Nicolas Verbeek; Fangzhou Xia; Yi Wang; Kamal Youcef-Toumi

Statically Stable Charge Sensing Method for Precise Displacement Estimation of Piezoelectric Stack-Based Nanopositioning Journal Article

In: IEEE Transactions on Industrial Electronics, vol. 68, no. 9, pp. 8550-8560, 2021.

Abstract | Links | BibTeX | Tags: Actuator, Experimentation, Instrumentation, Mechatronics, Modeling & Simulation, Motion Control, Piezoelectricity, Theory

4.
Modeling and Control of Piezoelectric Hysteresis: A Polynomial-Based Fractional Order Disturbance Compensation Approach

Chen Yang*; Nicolas Verbeek; Fangzhou Xia; Yi Wang; Kamal Youcef-Toumi

Modeling and Control of Piezoelectric Hysteresis: A Polynomial-Based Fractional Order Disturbance Compensation Approach Journal Article

In: IEEE Transactions on Industrial Electronics, vol. 68, no. 4, pp. 3348-3358, 2021.

Abstract | Links | BibTeX | Tags: Actuator, Experimentation, Instrumentation, Mechatronics, Modeling & Simulation, Motion Control, Piezoelectricity, Theory

2019

3.
Bandwidth Based Repetitive Controller Design for a Modular Multi-actuated AFM Scanner

Fangzhou Xia*; Chen Yang; Yi Wang; Kamal Youcef-Toumi

Bandwidth Based Repetitive Controller Design for a Modular Multi-actuated AFM Scanner Proceedings Article

In: IEEE American Control Conference (ACC), pp. 3776-3781, 2019, ISSN: 0743-1619.

Abstract | Links | BibTeX | Tags: Atomic Force Microscopy, Instrumentation, Mechatronics, Modeling & Simulation, Motion Control, Piezoelectricity, Theory

2018

2.
Design and Control of a Multi-actuated High-bandwidth and Large-range Scanner for Atomic Force Microscopy

Fangzhou Xia*; Stephen Truncale; Yi Wang; Kamal Youcef-Toumi

Design and Control of a Multi-actuated High-bandwidth and Large-range Scanner for Atomic Force Microscopy Proceedings Article

In: IEEE American Control Conference (ACC), pp. 4330-4335, 2018, ISSN: 2378-5861.

Abstract | Links | BibTeX | Tags: Atomic Force Microscopy, Experimentation, Instrumentation, Mechatronics, Modeling & Simulation, Motion Control, Piezoelectricity

1.
Charge controller with decoupled and self-compensating configurations for linear operation of piezoelectric actuators in a wide bandwidth

Chen Yang*; Changle Li; Fangzhou Xia; Yanhe Zhu; Jie Zhao; Kamal Youcef-Toumi

Charge controller with decoupled and self-compensating configurations for linear operation of piezoelectric actuators in a wide bandwidth Journal Article

In: IEEE Transactions on Industrial Electronics, vol. 66, no. 7, pp. 5392-5402, 2018.

Abstract | Links | BibTeX | Tags: Atomic Force Microscopy, Experimentation, Instrumentation, Mechatronics, Motion Control, Piezoelectricity, Theory

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